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2015-07-07 00:30:00.0 Topics

Displays Will Range from Newest Semiconductor Test Equipment to Novel Tester for Internet-Connected Retail Electronics

SAN JOSE, Calif. – July 7, 2015 – Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857, NYSE: ATE) will showcase its full range of test solutions designed to enable the Internet of Things (IoT) including automatic test equipment (ATE), terahertz measurement systems, multi-vision scanning-electron microscopes (SEM) and an e-beam lithography system at the SEMICON West 2015 trade show, coming July 14-16 to Moscone Center in San Francisco.

Products and Demonstrations in Advantest Booth #6143, North Hall

Advantest will feature the debut of two new products: the T5833 system, capable of wafer sort and final test of virtually any NAND Flash or DRAM devices, and the T2000 28G OPM, the company’s first module designed for testing high-speed optical transceivers used in sending and receiving data through optical fibers. Other booth displays will highlight the versatile V93000 platform’s capabilities in improving time to quality (TTQ) in multi-site radio-frequency (RF) applications and testing IoT devices; the M4871 and M6245 test handlers for system-on-chip (SoC) and memory ICs; the T2000 ISS for at-speed testing of fast CMOS image sensors; the T2000 IPS for integrated power device test solutions; and the T6391 all-in-one system for testing high-speed, high-pin-count display driver ICs (DDI). For advanced metrology and nano-patterning applications, the booth will include exhibits on Advantest’s TS9000 terahertz measurement systems, used in non-destructive inspection of IC mold thickness and electrical fault analysis TDR; the company’s line of E3310, E3640 and E5610 SEMs for inspecting next-generation wafers, photomasks and blanks; and the F7000 e-beam lithography tool for nano-processing challenges at the 10-nm technology node and below.

Also showcased in the exhibit will be demonstrations of an EVA100 tester for digital and analog testing of small-pin-count semiconductors; Advantest’s CloudTesting™ Service; and SmartBox™ -- an innovative, production and point-of-sale diagnostic test solution for smart phones, tablets and IoT devices. SmartBox was developed by W2BI, Inc., a member of the Advantest Group of companies.

Best Paper of the Year Nomination

In addition, technical authors from Advantest and a partner company are nominated for the Best ATE Paper of 2014, an industry honor to be presented during SEMICON West 2015 at the Test Vision 2020 workshop event. The paper titled “An ATE-Based 32-Gbaud PAM-4 At-Speed Characterization and Testing Solution” was originally presented at last November’s IEEE Asian Test Symposium in Hangzhou, China.

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For the latest developments from Advantest, follow the company on Twitter @Advantest_ATE.

Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.