Welcome and Overview
- Presented by Judy Davies, VP, Global Marketing Communications, Advantest
TOKYO, Japan – March 23, 2020 – Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) held its first virtual tradeshow on March 10-11 to maintain the flow of valuable technical, industry and market data among employees, customers and partners worldwide without risking exposure to COVID-19. Nearly 200 attendees representing 47 companies attended the informative, online sessions presented in multiple languages by a global group of speakers, including Advantest topic experts and executives from SEMI, the global industry organization representing the electronics-manufacturing supply chain.
"The success of this unique virtual tradeshow focusing on the semiconductor test industry shows the power of reacting quickly to changing market conditions to provide a valuable service to customers," said Judy Davies, vice president of global marketing communications at Advantest. "Thank you to all of our speakers. With their help, we accomplished our goals to help address the industry's information needs and provide opportunities for members of the global test community to interact with each other."
Recordings of the virtual tradeshow presentations are available until June 1.
Click the links below to access the recordings for each session using the passcode 'Advantest'.
Welcome and Overview
Standalone (SA) & Non-Standalone (NSA) 5G NR Device Testing: MIMO and Carrier Aggregation
SEMI Market Outlook: Fab Investment, Equipment/Material Markets and New Asia Supply Chain
5G NR Semiconductor Test Challenges
Test Cell Management for Enabling Smart Manufacturing
Driving for Perfection: Finding the Optimum Test Solution for Next-Generation Automotive ICs
Low-Cost Solution for Ultra-High-Speed SerDes to RF Communication Test Via Onboard FPGA
A Programming Framework of Concurrent Test on SmarTest 7 for IPs That Share the Same Access Port
5G NR Semiconductor Test Challenges (in Korean)
Test Cell Management for Enabling Smart Manufacturing (in Korean)
Low-Cost Solution for Ultra-High-Speed SerDes to RF Communication Test Via Onboard FPGA (in Chinese)
A Programming Framework of Concurrent Test on SmarTest 7 for IPs That Share the Same Access Port (in Chinese)
For all the latest news from the leader in test solutions, follow Advantest on Twitter @Advantest_ATE.
Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.