MPT3000ENV / MPT3000EV2
For Environment Test (RDT)
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution
The adoption of PCIe 3.0 and NVM Express, and the emergence of PCIe Gen 4 SSDs, are generating continued growth for SSDs. This rapid growth and increasing performance requires high performance tools for Reliability Demonstration Testing of SSD products. SSD manufacturers have reported that more flexibility to develop new products increases gross margins, and that earlier product introduction increases market share. Advantest designed its flexible MPT3000 systems to meet customers’ testing needs for both enterprise and client SSDs.
Up to 22.5 Gbps
To provide an efficient test solution for the SSD market, the MPT3000 combines Advantest's expertise in high-speed system-on-chip (SoC) testing with a state-of-the-art electronics architecture, including proprietary hardware acceleration and performance up to 22.5 Gbps.
Precise device thermal consistency
In addition to incorporating a chamber capable of maintaining precise device thermal consistency, the MPT3000 provides independent device power control for testing new high-power enterprise SSDs.
Multi-protocol capability and high parallelism
The system's multi-protocol capability and high parallelism enable full performance testing of a variety of SSD protocols (including SATA, SAS, PCIe up to Gen 4) and form factors (including AIC, U.2, M.2 and EDSFF “Ruler” devices. This versatility enables SSD manufacturers to pursue multiple business opportunities simultaneously and adapt to the sudden changes characteristic of high-growth markets.
The MPT3000's 256-site configurations, MPT3000ENV and MPT3000EV2, include a thermal chamber, target thermal-stress driven Reliability Demonstration Test (RDT) applications for SSDs of various form factors running a variety of protocols.