Semiconductor Analysis Solutions
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TDR Analysis (Fault Point Analysis for Open/Short and Other Faults)
TS9000 TDR option
TS9001 TDR system
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MTA Analysis (Mold Thickness Analysis)
TS9000 TS9000 MTA option
TDR: Time Domain Reflectometry
MTA: Mold Thickness Analysis
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- Product Catalog Terahertz Spectroscopic / Imaging Systems
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- Spectroscopic Imaging Broad Application Coverage
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- Imaging Analysis Non-invasive measurement of specimen interior structures
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