V93000 High Speed Memory

Memory Test Systems


Industry leading high-speed memory test platform,
offering at-speed final test and scalable to 8Gbps,
a 10 year system lifetime via economical upgrades and
superior throughput for lowest cost of test.

The Advantest V93000 High-Speed Memory (HSM) Series is the fastest final test solution available today offering highly accurate at-speed I/O and at-speed memory core access testing of up to 8 Gbps and future-ready upgradeability to higher data rates and higher parallel test capabilities for unique lifetime value and return on investment.


The HSM Series leverages the advanced test technology and extended architecture of the proven Advantest V93000 test platform to ensure high test quality and fast "yield learning" at the lowest cost of test in this memory category. Using the proven per-pin timing architecture of the V93000 platform, the HSM Series delivers the functionality to address the most demanding DRAM technologies, including DDR3, DDR4, XDR and GDDR, and provides the flexibility to address the requirements of future DRAM technologies to ensure your test investment is protected.

Proven in R&D and validation labs worldwide, the V93000 HSM is perfect for engineering and design verification with it’s scalable performance?up to 12.8 Gbps with HSM HX?plus compatibility with production systems.

V93000 HSM Platform

Industry leading high-speed memory final test, scalable to 8Gbps, with longest life, superior throughput and lowest cost of test.

The requirements of today’s high-speed memory - higher speeds, performance, production volume - means that test systems must offer greater functionality and parallelism while maintaining low cost of test. The scalable platform architecture of the Advantest V93000 HSM combines functionality, performance and flexibility into a single test system with unmatched overall test economics for outstanding return on investment.

Leveraging the proven per-pin timing architecture and technology components of the V93000 platform, the HSM series features significant architectural extensions addressing the unique requirements for final test of DRAMs, thus becoming a TRUE memory-ATE-per-pin architecture. With the majority of the functionality tightly integrated into the system’s test head, the platform offers superior performance, parallelism, unprecedented scalability and control.

The scalability of the V93000 HSM platform means it is future-ready, offering upgradeability to data rates beyond those of today - true investment protection for DDR3, DDR4 and future DRAM technologies.

Components and Options

System Infrastructure V93000 Infrastructure
Test-Head Options:
  • V93000 Large (64-slot) Test Head
  • V93000 Compact (16-slot) Test Head
Memory Test Cards
  • HSM6800
  • HSM4000
  • HSM3G
High-Speed Extension Card HSM HX
Device Power Supplies DC Scale DPS32 and MS-DPS cards
System Controller High Performance HP-LX Workstation
Software HSM Memory Test Software Bundle
Testcell partner products Custom Test Fixture Boards from TSE, Korea