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T5000 NAND FLASH (MCI Language)

Summary

Training Course Title T5000 Series MCI Basic User Training for NAND FLASH
Duration 60 days
Training Course Type Lecture and Labs
Training Course Level Core
Lab Package Yes
Target Audience
  • Test Engineers, Application engineers
  • A person who uses the T5000 series Memory Test System using MCI
Training Course Requirement
  • Learning about foundation of developing a Test program using MCI (Macro Control Interface)
Requisite Environment
  • SUSE Linux 9.2 or open SUSE 10.3 or CentOS 5.6 or CentOS 7 (use centOS5.6 (x64) in this material)
  • FutureSuite (use FutureSuite R5.35 in this material)
Learning objective
  1. Hardware Overview
  2. Software Overview
  3. FutureSuite GUI Tool Operation
    (Toolbox, Control Panel, Online manual, TCM, WTRC, Real Wave, Shmoo Plot, Pattern Tool, Pattern tracer, FBMAP, AFM monitor, Debugger Tool for MCI and ATL)
  4. ALPG Pattern Program
    (March pattern, Checkerboard Pattern, March pattern with 2way-Interleave Mode)
  5. Scramble Program
  6. Types of LSI Tests
  7. Socket Program
  8. Main Program Basic Configuration
  9. Device Pin Definition
    (Create Pinlist)
  10. Input Leak Test
    (Continuity Test, Input Leakage Test)
  11. Functional Test
    (Async Read, AsyncRead Pattern, NAND Flash DDR Interface, DDR Cache Data-in/Data-out Pattern)
  12. Power Supply Current Test
    (Icc Standby Test, Icc Active Test)
  13. FCM Settings
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