Advantest Launches New nanoSCOUTER™ Particle Measuring Equipment

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WEL2100 Enables High-Precision Measurement of LNP For DDS & Other Particles

TOKYO, Japan —June 17, 2024— Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has announced the launch of the WEL2100, a new product in the nanoSCOUTER™ particle measuring equipment family.

The WEL2100 is a fine particle measurement instrument that utilizes a precise nanopore (nanometer-scale pore) sensor device, made with semiconductor manufacturing processes and microcurrent measurement technology, for measurement of particles such as lipid nanoparticles for drug delivery systems, viruses, and exosomes. Quantity, particle size, and zeta potential can be measured for each individual particle with high speed and high precision. Advantest's proprietary APT-Pore™ device enables more precise measurement of the size distribution of particles smaller than 30 nm while a new pressure application mechanism makes it possible to smoothly measure electrically neutral particles and low-concentration samples.

The WEL2100 is ideally suited for pharmaceutical and biotechnology R&D. The company aims for future adoption in medicine and a wide range of other fields.

Particle Measuring Equipment nanoSCOUTER™ WEL2100

Product Features

Low Cost, Small Footprint

The nanoSCOUTER™ employs an electrical method based on the Coulter principle that measures changes in the current waveform when particles pass through a nanopore through which an electric current is passed. This enables a comparatively lower price and smaller footprint than optical measurement instruments which require a light source.

APT-Pore™, A Proprietary Device

In electrical particle measurement instruments, the precision of the nanopore strongly affects the accuracy of the measurement. Advantest's independently developed APT-Pore™ is a pore device with a minimum pore diameter of 50 nm that delivers high-precision, low-noise measurement. Formed with EB lithography, the solid-state pore does not require calibration for each measurement, making measurement easier and faster.

Particles Measured Individually

By measuring the small changes in the current waveform when a particle passes through the nanopore, the WEL2100 can measure the size and zeta potential of each individual particle.

New Pressure Application Mechanism

This mechanism increases the frequency at which particles pass through the nanopore, improving measurement throughput. It also enables the measurement of electrically neutral particles.

Product Specifications

Can be swiped left or right.
Dimensions 330 mm (W) × 260 mm (D) × 136 mm (H)
Weight 4.5kg
Operating Temperature 10℃~40℃
Humidity Tolerance Below 80% with no condensation
OS Windows10/11 64bits

Please note that at present, it can only be used within Japan.

Inquiries

Particle Measurement Department
Email : info_minascouter@advantest.com

About Advantest Corporation

Advantest (TSE: 6857) is the leading manufacturer of automatic test and measurement equipment used in the design and production of semiconductors for applications including 5G communications, the Internet of Things (IoT), autonomous vehicles, high-performance computing (HPC), including artificial intelligence (AI) and machine learning, and more. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. The company also conducts R&D to address emerging testing challenges and applications; develops advanced test-interface solutions for wafer sort and final test; produces scanning electron microscopes essential to photomask manufacturing; and offers system-level test solutions and other test-related accessories. Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. More information is available at www.advantest.com/en/.

  • Note:
    All information supplied in this release is correct at the time of publication, but may be subject to change.
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