Delivers Industry-Leading Simultaneous Measurement and Cost Efficiency for LP-DDR5 and DDR5 Testing
Memory devices are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. Applications ranging from mobile devices and data centers to automobiles, gaming systems, and graphics cards require an enormous amount of DRAM capacity. Next-generation memory devices with high-speed data transfer capabilities are being developed to meet growing market demand. Advantest's T5503HS2 tester is designed to handle these high-speed memory ICs.

Fast Devices Require a Fast Test Solution
The T5503HS2 is designed for evaluating DUTs at speeds up to 9 Gbps with an overall timing accuracy of ±45 picoseconds. Utilizing an optional 4.5-GHz high-speed clock, the tester is sufficiently scalable to support faster, next-generation memory devices.
This highly versatile system uses 16,256 channels to achieve the industry's highest parallelism and best cost efficiency in testing SDRAM semiconductors as well as existing DDR4 ICs, LP-DDR4 devices, and high-bandwidth memory (HBM) devices.
Advanced Memory Testing
The system's built-in capabilities enable the T5503HS2 to support advanced features on both LP-DDR5 and DDR5 devices. It automatically recognizes and adjusts DQS-DQ timing differences to secure better timing margins by real-time tracking, and its robust algorithmic pattern generator (ALPG) facilitates rapid, high-quality testing of innovative device features.
In addition, a new programmable power supply with response times that are four times faster than its predecessor enables a far lower voltage drop.
Scalability for the Future
Installed T5503 testers can be upgraded seamlessly and economically to T5503HS2 systems, allowing users to easily update their production floors to accommodate the next generation of memory devices. With this scalability, the T5503HS2 tester can continue to deliver the high productivity, high accuracy, and cost-effectiveness needed to maximize ROI.