T2000 Flexible Platform Addresses Diverse Test Needs
SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor manufacturers struggle with requirements to replace their testers on a 2-3 year cycle.
The T2000 platform adopts a module architecture and can be flexibly reconfigured by rearranging the necessary functional modules according to the application. A rich variety of functional modules, including digital, high-performance analog, power-mixed signals, and image capture, provide a wide range of test coverage and offer solutions at optimal cost. This makes it possible to have a scalable system configuration ranging from an air cooling system with 9 slots to a liquid cooling system with 52 slots and up to 8,192 channels.
Advantest provides compact solutions with reduced initial investment for development and small lot productions, and high-efficiency multiple-DUT parallel measurement solutions for mass productions. The T2000 responds quickly to market needs with minimal capital investment.
While chipmakers enhance the functionality of semiconductor devices and increase multi-functionality, they need to reduce development times. Advantest's T2000 is ideal for testing these devices.
Time to Market Reduction - Multi-Session
The T2000 makes it possible to develop device test programs efficiently with minimal investment. With the multi-site CPU architecture unique to the T2000, multiple users can log in to a single test system at the same time, and perform debugging work independently. Up to eight people can work simultaneously, contributing to both engineering cost savings and TTM reduction. In addition, eight people can develop separate functions for the same device concurrently, which greatly shortens development times.
Best-In-Class Parallel Test Efficiency - Multi-Site Controller
As more DUTs (Devices Under Test) are measured simultaneously, overhead tends to increase, and test times in general tend to be longer. However, the T2000 reduces test time and achieves high throughput with highly efficient multi-site test technology that completely eliminates overhead.
Test Time Reduction - Concurrent Test
The T2000 supports concurrent test functionality which can execute complex device test in shorter times. Concurrent test can be more easily achieved than in the past, as the T2000 can seamlessly switch between sequential execution and parallel execution of multiple test items. In addition, its concurrent test functionality enables users to rapidly develop test programs with short test times.
Test Cost Reduction
With up to 8,192 digital channels, the T2000 achieves more than twice the parallelism of the previous model, reducing test cost.
T2000 Product Lineup
Software
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Windows Based Operating System. Easy to Use. Easy to Customize.
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Rapid Development Kit (RDK) Environment: Easy Coding, High Code Reusability, and Fast Debug.
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Versatile Offline Environment: Thorough T2000 System Software Emulator.
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Abundant Tester Tools: Wave Tool (Logic Analyzer, Oscilloscope), Shmoo, Pattern Editor, etc.
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Instrument Slicing, Test Condition Runtime Optimizer, Multi-session, Concurrent Test Flows.
SoC Test Solution
High-performance, low-cost SoC test solution optimized for high-volume manufacturing of today's complex consumer devices.
Achieve feature-rich capabilities with high precision
In the ever-evolving digital consumer market, devices are becoming more sophisticated and diversified in terms of functionality with:
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Multi-Time Domain functionality for testing several frequency domains simultaneously.
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1GDM / 1.6GDM realizes low cost of test by high parallel testing.
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DSP192A module supports 96-ch device power supply by high density mounting.
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Analog modules (BBWGD/GPWGD) full-spec test, covering high-performance audio to video and baseband.
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PMU32E module capable of handling a broad spectrum of precision test including ADC/DAC linearity.
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8GDM corresponds to high-speed interface device testing.
Flexibly combined with these test modules, T2000 provides customers with an optimized test solution for consumer devices.
Analog modules provide broad coverage.
Integrated Power Device Test Solution
We provide solutions for high-performance, high-throughput testing of devices for automotive, industrial and power management applications.
Setting a New Standard
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High flexibility and ease-of-use due to a multi-functional mixed-signal architecture.
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Low cost of test with high parallelism.
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Increased throughput with pattern-controlled test conditions.
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Enhanced test efficiency using per-channel time measurements.
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Simple load board Design by Cross function port and matrix functionality.
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Best-in-class performance, including fast range switching hardware, fast switching relays and concurrent hardware operation.
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Simplified coding enabled by the rapid development kit (RDK) software package, which provides a user-friendly environment for developing reusable code and implementing fast debugging.
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Wide coverage for testing on the same platform, from low-voltage communication PMICs to high-voltage automotive ASSPs.
Optimized Modules for Power Mixed Signal Test
CMOS Image Sensor Test Solution
We provide a test solution that minimizes test cost by flexibly supporting measurement of the newest CMOS image sensors with leading-edge high-speed interfaces.
Flexible Support for Multifunctional Image Sensors
CMOS image sensors have a variety of built-in functions
including AD/DA and logic circuits.
By combining
measurement modules according to the functions required for
testing specific image sensors, the T2000 achieves a scalable
system configuration.
High speed Image Capture up to 4.8Gbps
The T2000 image sensor test solution can capture the image
output from CMOS image sensors utilized in applications
including smartphones, security cameras, and
automotive/industrial cameras.
Its dual bank memory
configuration minimizes test time by storing data and
transferring it to the IP engine at the same time.
Differential Input
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MIPI D-PHY V2.1：4.8Gbps
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MIPI C-PHY V1.2：3.5Gsps
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MIPI A-PHY® *Option
Capture Memory：1,024M pixel x 2bank
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Available to continuously store max. 64,000 frames of the image data
High-Speed Image Processing Engine for Higher-Resolution Image Sensors
Advantest’s new IPE4 (Image Processor Engine 4) uses
heterogeneous computing technology to achieve high-speed image
processing.
In conjunction with a specially developed
image processing library, it minimizes the increase in test
time driven by ultra-high sensor resolution.
Maximum 64 DUT Parallel Test Capability Reduces Test Cost
The T2000 can measure multiple DUTs simultaneously, improving
the productivity of image sensor chips and lowering test
costs.
With a wide user area and a light source with an
enlarged irradiation area, it can perform parallel measurement
of up to 64 DUTs.
T2000 module configuration for CMOS image sensor testing
Scalable System Configuration
| R&D, Small Lot Production | Mid Volume Production | High Volume Production | |
|---|---|---|---|
|
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| Parallel Test | 16 | 32 | 64 |
| Main Frame | LSMF | LSMF | LSMF+EXMF |
| Test Head | 13 slot | 46 slot | 46 slot |
Digital
1GDM/1.6GDM
T2000 256-ch 1 Gbps Digital Module/
T2000 256-ch 1.6 Gbps Digital Module
Digital module operating at 1.6 Gbps max. and equipped with
up to 256 I/O channels.
It is equipped with SCAN, ALPG,
or other pattern generators and per-pin PMU, and it has
standard functions that fulfill the test requirements for
various devices such as MPU, FPGA, and MCU.
2GDME
T2000 256-ch Enhanced 2 Gbps Digital
Module
Digital module operating at 2 Gbps max. and equipped with up
to 256 I/O channels.
It also supports voltage output
testing for automotives.
500MDM
T2000 128-ch 500 Mbps Digital Module
Digital module for Air cooling that is operating at 500 Mbps
max. and equipped with up to 128 I/O channels.
It has
the functions equivalent to those of the 1GDM module. A
system that takes less space can be configured when used in
combination with T2000 AiR.
8GDM
T2000 8 Gbps Digital Module
High-speed testing is available at the maximum operation
speed of 8 Gbps, and each module is equipped with up to 96
I/O channels.
It enables effective testing of serial
and parallel interfaces.
DPS / VI
DPS32A
T2000 32-ch Device Power Supply 32A
The DPS32A module is used to supply power to the device that
is being tested.
It is equipped with 32 channels. Each
channel can supply a maximum current of 1A.
A system
that takes less space can be configured when used in
combination with T2000 AiR.
DPS90A
T2000 64-ch Device Power Supply 90A
The DPS90A module is used to supply power to the device that
is being tested.
It is equipped with the 2A_Function
and 0.8A_Function, which can supply a maximum current of 2A
and 0.8A per channel, respectively.
DPS192A
T2000 96-ch Device Power Supply 192A
The DPS192A module is used to supply power to the device
that is being tested.
It is equipped with the
3A_function, 2A_function, and 1A_function, which have
different maximum current supply capabilities, making it
possible to supply power more efficiently to the device that
is being tested.
DPS150AE
T2000 Enhanced Device Power Supply
150A
The DPS150AE module is used to supply power to the device
that is being tested.
It is equipped with the
HC_Function and LC_Function, which can supply a maximum
current of 16A and 2.66A per channel, respectively.
Parallel
operation makes it possible to supply current at 1000A and
higher.
PMU32E
T2000 32-ch Enhanced Multi-purpose Parametric
Measurement Unit
The PMU32E module is equipped with the function to generate voltage and measure current, as well as the function to generate current and measure voltage. It is used to perform DC parametric tests and DC linearity tests for AD and DA converters.
Analog / RF
GPWGD (HR)
T2000 32-ch General Purpose Arbitrary
Waveform Generator/Digitizer
The GPWGD module is composed of the general-purpose
arbitrary waveform generator, general-purpose waveform
digitizer, reference voltage generator, and parametric
measurement unit, and supports analog measurements for audio
and video devices, etc.
It has a high dynamic range
property, which is required for digital audio devices.
BBWGD
T2000 16-ch Baseband Arbitrary Waveform
Generator/Digitizer
The BBWGD module is composed of the baseband arbitrary waveform generator, baseband waveform digitizer, clock generator, and parametric measurement unit; and supports high-precision measurements of baseband signals.
WLS32-A
T2000 12 GHz Wideband Signal
Generator/Measurement Module
The WLS32-A module is equipped with an RF signal generation function, analysis function, measurement function, and reference clock signal generation function; and supports RF measurements for mobile phones, wireless LAN, etc.
Automotive / PMIC
MMXHE
T2000 64-out Enhanced, High Voltage, and Multi
Functional Mixed Module
The Multi Function Mixed High Voltage (MMXHE) module is a multi-function mixed signal module that has 32 digital channels with high voltage magnitude and 32 parametric measurement unit (PMU) channels. Those digital channels and PMU channels can switch I/O alternatively. Each PMU channel is equipped with an arbitrary waveform generator (AWG), which allows channel-to-channel synchronization and a digitizer (DGT). In addition, the module enables time measurement per pin from various resources and also has a differential voltmeter, which can access all channels, and an IDDQ test function.
MFHPE
T2000 36-out Enhanced and Multi Functional
Floating High Power Module
The Multi Function Floating High Power (MFHPE) module is a multi-function power mixed signal module that has 18 channels of floating VI resources. It can be used as a device power supply or load resource based on the pulse and static conditions. By connecting multiple channels in series or in parallel, the requirements for higher voltage and higher current capacity can be fulfilled. In addition, each VI resource is equipped with an arbitrary waveform generator (AWG), which is used for modulation in the voltage or current mode and a digitizer (DGT), which is used for the simultaneous measurement of voltage and current. It also enables time measurement per channel from various resources.
MPCM
T2000 72-out Multi Functional and Cross Point
Matrix Module
The Multi-function Power Cross Point Matrix (MPCM) module allows the MFHPE channel to be connected to multiple DUT pins. By using its dedicated GND, floating measurement and ground reference measurement can be performed in the same application. In addition, the parametric measurement unit (PMU) makes it possible to conduct a parallel contact test, kelvin check, and parametric test.
Image Sensor
4.8GICAP
T2000 4.8 Gbps Image Capture Module
The 4.8G ICAP module is used to test the CMOS image sensors.
The module can capture image data that complies with the
MIPI standards D-PHY Ver. 2.1 and C-PHY Ver. 1.2 at high
speed.
The D-PHY has one pair of clocks and four pairs
of data per channel, and can capture images at a data rate
of 100 Mbps to 4.8 Gbps.
The C-PHY has a trio of three
wires per channel and can capture images at a data rate of
800 Msps to 3.5 Gsps. Each module can measure up to four
devices simultaneously.
In addition, the PMU can
interrupt each input line, and the DC voltage can be
measured.
The T2000 makes it possible to have a scalable system
configuration ranging from an air cooling system with 9 slots to
a liquid cooling system with 52 slots and up to 8,192
channels.
We provide compact solutions with reduced initial
investment for development and small lot productions and
high-efficiency multiple-DUT parallel measurement solutions for
mass productions. With the T2000, we can recommend the optimal
configuration for your measurement needs.
T2000 Today
T2000 AiR Overview
