Power semiconductors tester platform
MT System is a configurable test equipment suitable to verify static and dynamic parameters of power semiconductors (i.e. IGBT, MOSFET, DIODE, THYRISTOR) including the latest Wide Bandgap device technologies (Silicon carbide (SiC), Gallium nitride (GaN), etc.)
MT Family
MT System is a configurable test equipment suitable to verify static and dynamic parameters of power semiconductors (i.e. IGBT, MOSFET, DIODE, THYRISTOR) including the latest Wide Bandgap device technologies (SiC, GaN, etc).
Specific tester configuration and ranges allow full coverage of device typologies reaching up to 10KV-10KA on static tests and 6KV-18KA on dynamic test.
Advantages and Benefits
MT tester family enables outstanding power device test coverage and CoT advantages.
Unique tester’s family able to cover all the production phases:
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Wafer sort test
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Bare dice test (KGD)
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Substrate (DBC/AMB) test
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Discrete or complex module test
Full test coverage: DC, AC, and SCT test performed according to the international standards (IEC, JEDEC).
Tailored tester configurations allow to perform Static or Dynamic or both (combo) in a single tester.
Up to 10kV generators, combined with up to 18kA current capability satisfy all the specific market requirement: industrial, automotive, renewal energy, railway and power grid.
Unique tester’s family able to cover all the production phases:
Full test coverage: DC, AC, and SCT test performed according to the international standards (IEC, JEDEC).
Tailored tester configurations allow to perform Static or Dynamic or both (combo) in a single tester.
Up to 10kV generators, combined with up to 18kA current capability satisfy all the specific market requirement: industrial, automotive, renewal energy, railway and power grid.
MT nomenclature
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S STATIC
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D DYNAMIC
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H Hi-VOLTAGE
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W Lo-CURRENT (Wafer)
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P Hi-CURREN
ADP Adapter series
The ADP adapters are conceived to move and contact the unit under test.
Featured with temperature conditioning and standard MT family fixtures docking system.
The ADP can be connected to tester to built a stand-alone test setup for engineering (prototype testing, or new test programs development) or characterization purposes.
Advantages and Benefits
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Small footprint
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Cost-effective solution for laboratory purposes
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Closed loop temperature control system (ATC) from ambient up to 200°C
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Hard docking with MT family tester cabinets
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Compatible with fixtures used in volume production
FIXTURE SYSTEM
The Fixture System is the mechanical contactor adapter designed to interface the Device Under Test (DUT) with the tester instrument.
Each adapter is designed according to the device’s physical geometry and to minimize the circuitry stray parameters, mandatory requirement to enable the dynamic test measurements.
