Advantest Announces New T5830 System for Cost-Efficient Testing of High-Volume, Cost-Sensitive Flash Memories

2016/03/29 Products

New System Adds to Advantest’s Product Line of Testers for Semiconductor Memories Used in Mobile Electronics

TOKYO, Japan – March 29, 2016 – Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857, NYSE: ATE) has introduced the new T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices.

As portable applications are booming, the global market for flash-memory test systems is projected to reach $148 million by 2018, according to market analysis firm VLSIresearch. Cost-effectively testing these non-volatile memories requires a versatile platform to enable a high return on investment (ROI) and reduce users’ financial risk.

The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories. It uses a scalable, built-in high-current programmable power supply (PPS) architecture that provides the flexibility and economic performance to handle low-pin-count to high-pin-count devices. The system also leverages Advantest’s innovative Tester-per-Site™ design. This allows each site to operate independently, enabling very fast test times and lowering the overall cost of test.

With an operating frequency of 400 MHz, the tester is capable of handling data transfer rates of up to 800 megabits per second (Mbps). In addition, the T5830 can handle up to 2,304 devices under test (DUTs) at one time when configured with four digital pins.

With these features, Advantest’s new tester is ideally suited for handling a wide range of devices including NOR and NAND flash memories that use the standard serial peripheral interface (SPI) protocol, low-pin-count flash devices such as smart cards and single in-line memories (SIM), electrically erasable programmable read-only memories (EEPROMs) and other embedded flash devices.

“Our newest memory tester delivers full ATE (automatic test equipment) capability and scalable performance to address the booming IoT (Internet of Things) and smart card markets, such as those in China and Taiwan,” said Masuhiro Yamada, executive officer at Advantest Corporation.

The T5830 tester is available in both production and engineering models, making the system applicable for qualification testing as well as high-volume production. It is built on the same platform and uses the same FutureSuite™ software as all other members of the T5800 product line. This enhances the system’s reliability and provides modular upgradeability.

Unit shipments to customers are scheduled to begin in the second quarter of this year.

Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.