Advantest Announces TAS7400TS High Frequency Resolution Option New Measurement Solution Enables Materials Characterization for Beyond 5G

2021/09/30 Products

Low Cost, Space-Saving Footprint, Easy Operation

TOKYO, Japan ? September 30, 2021 ? Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has announced a high frequency resolution option for its TAS7400TS terahertz optical sampling analysis system. Featuring excellent cost performance and ease of operation, the new option provides a groundbreaking measurement method for high-frequency characteristic evaluation of radio wave absorbers and base materials, which are indispensable for Beyond 5G / 6G next-generation communications technology and for the millimeter-wave radar technology used in ADAS (advanced driver assistance systems).

Vector network analyzers (VNAs) have been widely used to evaluate the transmission characteristics (transmittance, reflectance) and complex permittivity of various materials in the millimeter-wave and high-frequency regions. But in recent years, it has become important to evaluate these characteristics over wider bandwidths, raising issues with VNAs on account of the time and effort required to set and calibrate each frequency band.

Advantest's terahertz optical sampling system addresses these issues by enabling batch measurement over a wide band, utilizing pulsed electromagnetic waves. Measurements are now possible with a compact optical sampling system (measurement environment), saving on cost and space. It is also possible to analyze surface frequency characteristics with the mapping measurement option. Furthermore, the frequency resolution and scan speed of the new option are 5x that of the previous product, making this an optimal solution for evaluating the high frequency characteristics of new materials.

The solution will be exhibited at JASIS, from November 8th to 10th, and at MWE 2021, from November 24th to 26th.

Key Specifications

Frequency Range 0.03~2 THz (Bandwidth (SNR = 1))
Frequency Resolution 380 MHz (previous product: 1.9 GHz)
Scan speed 40 ms / scan (previous product: 200 ms / scan)
Measurement Items transmittance, reflectance, phase difference, complex permittivity, Dissipation factor (tanδ)
  • Terahertz Optical Sampling System TAS7400TS

About Advantest Corporation

Advantest (TSE: 6857) is the leading manufacturer of automatic test and measurement equipment used in the design and production of semiconductors for applications including 5G communications, the Internet of Things (IoT), autonomous vehicles, artificial intelligence (AI), machine learning, smart medical devices and more. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. The company also conducts R&D to address emerging testing challenges, produces multi-vision metrology scanning electron microscopes essential to photomask manufacturing, and offers groundbreaking 3D imaging and analysis tools. Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. More information is available at

Note: All information supplied in this release is correct at the time of publication, but may be subject to change.