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2014-11-25 00:00:00.0 Products

New PMU32E Module Doubles the Resolution and Accuracy of its Predecessor

TOKYO, Japan – November 25, 2014 – Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857, NYSE: ATE) has launched a new multi-purpose parametric measurement unit (PMU) module, the T2000 PMU32E, to enhance its T2000 platform’s capabilities in testing digital, analog and power-management system-on-chip (SoC) devices. The new high-density, 32-channel module is fully compatible with Advantest’s original PMU32 module – even using the same tester interface unit (TIU) – while offering twice the resolution and accuracy. This enables a T2000 tester equipped with the new PMU32E module to achieve high-level measurement accuracy, set-up time and gang functionality similar to those of a T2000 EPP (Enhanced Performance Package) tester.

"By using our new PMU module with its built-in performance improvements, our customers can gain the functionality of an EPP tester at a lower capital investment," said Dr. Toshiyuki Okayasu, executive officer and executive vice president, SoC Test Business Group at Advantest Corporation.

With the T2000 PMU32E, the measurement time is more than two times faster than with the earlier module. In particular, DC linearity measurement time is much faster due to an enhanced sampling rate and enhanced data transfer. These faster operating speeds lead to significantly higher throughputs and a lower overall cost of test.

Operating efficiency is further improved by the new module’s ability to run test programs already developed for the earlier PMU32 module. In addition, the new module features twice as much memory capacity, expanding the capabilities of the channel-independent arbitrary waveform generator (AWG) and digitizer.

The PMU32E also supports load testing of on-die regulators (ODR) with its ISVM (current source and voltage measurement) ganging function.

Advantest expects to begin shipping PMU32E modules to customers by the first quarter of 2015.

Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.