News News

2011-11-29 00:00:00.0 Topics

TOKYO, Japan, – November 29, 2011 – Advantest Corporation (TSE: 6857, NYSE: ATE), a leading provider of test equipment to the global semiconductor industry, will exhibit at SEMICON Japan 2011, December 7-9, at Makuhari Messe in Chiba Prefecture.

SEMICON Japan is the world’s largest semiconductor manufacturing equipment and materials trade show. Under the theme, "“From Fusion Comes Power,” Advantest will exhibit a slate of test solutions and products representing capabilities from both the Advantest and Verigy portfolios.

Dates :

Wednesday December 7 ~
Friday December 9
10:00 a.m. ~ 5:00 p.m.

Venue :

Makuhari Messe, Chiba, Japan

Booth :

International Exhibition Hall 3
  (Front-end Zone), 3C-719

International Exhibition Hall 8
  (Back-end Zone), 8C-901

International Exhibition Hall 8
  (Secondarily-equipment Pavilion), E-07


Exhibition Highlights

At Semicon Japan, Advantest will showcase its latest test systems and technologies, capitalizing on the strengths of both Advantest and Verigy products. These new systems help to lower the cost of test through increased parallel DUT testing capacity.
Also, Advantest will exhibit in the Front-end Zone for the first time, showcasing SEM that make multi dimensional observation and measurement possible, and will display the features and capabilities of its electron beam lithography system through graphic representation.

  • img_nr_20111129_02
    T2000 Enhanced Performance Package (Exhibition Hall 8)
    The T2000 offers customers a solution tailored to their testing needs with modules that can be combined flexibly. The new Enhanced Performance Package (EPP) together with modules supports Functional Test Abstraction (FTA), which enables system level IC design verification programs on ATE. The EPP and modules also features Multi Session capability, which allows multiple users to use the system at the same time, and is compatible with Concurrent Test, where multiple test programs can be executed in parallel. These features enable reduced lead time from design to functional testing of complex SoCs and lower cost in mass production.
  • img_nr_20111129_03
    V93000 Smart Scale(∗) (Exhibition Hall 8)
    With a phase-synchronized circuit for each pin, the V93000 Smart Scale enables data rates to be set per pin, making System-like Stress Test, where the device under test is tested in conditions close to its actual use, possible. The system features four test head sizes, with seamless compatibility between them, meaning flexibility in regard to production volume changes. The Smart Scale A-Class, the smallest, will be on display at this year's exhibition.

    ∗:V93000 Smart Scale is a Verigy Product

  • img_nr_20111129_04
    E3630 Multi Vision Metrology SEM (Exhibition Hall 3)
    The E3630 is a new generation Multi Vision Metrology SEM that features multi-channel detection technology. The system not only features traditional Critical Dimension measurement capability, which utilizes electron-beam technology, but also 3D measurement capability, including Side Wall Angle technology, which is needed in 1Xnm process nodes.


∗: For more information, please see the Advantest SEMICON Japan website: .

∗: For registration information and other exhibition details, please see the SEMICON Japan website: .

Further Enquiries

Please Contact the Public and Investor Relations Section at : +81-3-3214-7500

Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.