New MPT3000ES Provides Powerful SSD Test Tools at the Engineer's Desk
TOKYO, Japan - August 6, 2014 - Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857, NYSE: ATE) has introduced the next product in its MPT3000 family for testing advanced solid-state drives (SSDs) by launching the flexible MPT3000ES engineering station. While using the same high-performance electronics and powerful software as the original MPT3000 unit, the new station features a small footprint configured to test up to eight SSDs in parallel. The system's small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.
As a standalone system, the MPT3000ES is a valuable addition to any engineer's toolbox for SSD analysis and debugging. It helps customers accelerate SSD product development and time-to-manufacturing ramp. The system's electronics provide 12-Gbps signaling and independent power supplies for each SSD allow full performance testing.
The MPT3000ES has changeable application boards to handle multiple form factors such as 2.5-inch drives, half- and full-height PC cards, M.2 and devices with customized form factors. Along with the station's multi-protocol support, this flexibility enables SSD manufacturers to pursue multiple business opportunities simultaneously using a single test platform.
The station uses the same proven, easy-to-use StylusTM software tools and revolutionary multi-protocol hardware architecture as the original MPT3000, making it very user friendly. Test programs can be ported directly between the MPT3000ES and the larger MPT3000 for simplified program development and correlation during SSD bring-up and qualification through production.
Advantest has already received multiple orders for the new MPT3000ES engineering station and is now shipping units to customers.
Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.