Leading OSAT Selects Tester for Ability to Perform High-Speed, Low-Cost Testing of the Newest Consumer Connectivity ICs
TOKYO, Japan — August 7, 2014 — Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857, NYSE: ATE) has shipped its 1,000th V93000 Smart ScaleTM tester, with the historic system going to long-time customer Amkor Technology, one of the world's largest providers of contract semiconductor assembly and test services and a strategic manufacturing partner for more than 300 of the world's leading semiconductor companies and electronics OEMs. Amkor will use the system, configured with Pin Scale 1600 and Pin Scale 9G cards, to cost-efficiently test the newest generation of semiconductors supporting High-Definition Multimedia Interface (HDMI®) and Mobile High-Definition Link (MHL®) technologies manufactured by Silicon Image, Inc.
"Advantest's V93000 is the leading production-proven system capable of achieving 6-Gbps performance and higher that meets the stringent testing and cost requirements of high-volume ICs targeted for mobile and consumer electronics products," said Ziaus S. Molla, director of operations engineering at Silicon Image, Inc.
"More and more customers are requesting high-speed test capabilities for their cost-sensitive devices," said Jong Bum Kim, senior vice president of worldwide test sales at Amkor. "The V93000 Smart Scale has the configurable flexibility and wide application coverage that enable Amkor to meet these requirements."
With the V93000 platform's scalable design, the tester can be configured for different speeds, analog and radio-frequency (RF) performance to meet each customer's unique test needs for a large variety of low-cost devices.
"For the 28-nm node and beyond, our V93000 platform sets the standard in test by providing the industry's most versatile test solution," said Hans-Juergen Wagner, senior vice president, SoC Business Group at Advantest Corporation. "In addition to its leading performance and accuracy, this well-established platform enables our customers to drive down the cost of test and shorten their time to market for new designs."
All classes of V93000 Smart Scale testers are compatible, enabling customers to redirect their product flow from one class of tester to another as IC production volumes and testing requirements change over time.
The V93000 test platform, widely used by Amkor and other outsourced semiconductor assembly and test (OSAT) companies worldwide, features a universal per-pin architecture that provides the most flexible and economical test solution for advanced semiconductor designs. By using the company's Pin Scale 1600 digital channel card, which offers the widest scale of capabilities on each digital channel, this tester can perform any function needed for a device under test (DUT). Advantest's innovative technology allows each pin to run with its own individual clock domain, providing full test coverage by matching the precise data-rate requirements of any DUT. This enables the V93000 to conduct power supply modulation, jitter injection, protocol communication and other key functions, offering system-like-stress testing at the ATE level.
Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.