New Test Solution Integrates Multiple Capabilities to Support Device Testing from Engineering to the Production Floor
TOKYO, Japan - May 27, 2014 - Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857, NYSE: ATE) has released its new EVA100 measurement system, an evolutionary value-added platform that combines digital and analog testing capabilities to handle small-pin-count analog, mixed-signal and sensor semiconductors.
The EVA100's expandable architecture provides the flexibility to conduct a wide range of measurement functions. Operation is highly intuitive, alleviating the need for users to have advanced programming skills and helping customers to get their latest ICs to market faster.
Designed for use in both engineering and volume-production environments, the EVA100 allows simultaneous control of multiple test functions to achieve highly precise measurements and improve testing efficiency. By integrating analog-voltage and current-source measurements, an eight-channel, 100-Mbps pattern generator and an oscilloscope in one compact, lightweight system, the EVA100 also eliminates the need for complicated cabling to connect and coordinate the various instruments.
"Analog and mixed-signal ICs are critically important in enabling the increasing performance, higher accuracy and longer reliability of today's smart electronics," said Satoru Nagumo, executive officer of Advantest Corporation. "Our new monolithic test solution eliminates the high cost, complex set up and long lead times required when using several kinds of measurement instruments to test these devices."
EVA100 Measurement System
Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.