New DPS150AE Module Provides High-Throughput, Multi-Site Testing Capability for High- and Low-Current Semiconductors
TOKYO, Japan - June 26, 2014 - Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857, NYSE: ATE) has announced its new T2000 Enhanced Device Power Supply 150A (DPS150AE) module that enables its T2000 test platform to handle the load requirements for highly accurate testing of both high-current and low-voltage semiconductors, including microprocessor units (MPUs), application-specific ICs (ASICs) and field-programmable gate arrays (FPGAs). The module improves the capabilities of the T2000 platform in performing high-throughput, multi-site testing of targeted devices with the lowest cost of test.
Available as a field upgrade or as a factory-installed option on the T2000 EPP (Enhanced Performance Package) system, the DPS150AE module greatly increases testing versatility. With the module's high-speed bus capability and Advantest's Smart Test Condition Memory (TCM), the T2000 EPP system enables module splitting in which one module can test multiple devices concurrently. Each device under test (DUT) can be monitored and assessed independently.
The new module also allows test conditions to be set and, if necessary, adjusted much more quickly with TCM. This function pre-loads all of a test program's parameters and includes an editing function so that test engineers can graphically modify any of the settings on the fly.
The DPS150AE has eight channels of high current (HC) functions that support a large current output as high as 16 amps and eight channels of low current (LC) functions that support a current output of up to 2.66 amps. It also has a function that operates multiple channels connected in parallel beyond the module. This allows the module to accommodate up to 80 channels of HC functions, each providing 16 amps, to generate up to 1,280 amps for high-current devices.
"Our new DPS module's high parallelism and ability to perform highly cost-effective testing over multiple power domains allow customers to quickly and efficiently test a wide range of IC types," said Dr. Toshiyuki Okayasu, executive officer and executive vice president, SoC Test Business Group at Advantest Corporation. "The system's flexibility enables low-cost testing and helps our customers to bring their newest device designs to market much faster."
The DPS150AE is scheduled to begin shipping to customers in August.
Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.