Installation Marks the First Use of an Advantest V93000 Dragon System in Highly Parallel RFID Device Testing
TOKYO, Japan - July 30, 2013 - Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857, NYSE: ATE) has announced that Shanghai Huahong Integrated Circuit Co., Ltd. (SHHIC), a leading supplier of radio-frequency (RF) smart cards and information-security ICs, is the first chip maker to use Advantest's V93000 Smart ScaleTM generation tester in the low-cost Dragon configuration for highly parallel testing of RFID semiconductors. The tester's Universal Pin architecture, available on all Smart Scale systems, eliminates the need for analog cards, making it ideal for cost-sensitive, high-parallel applications.
The V93000 Dragon system will be used in engineering development and production testing of RFID devices for banking cards. A 32-site parallel test solution has been qualified and SHHIC is scheduled to progress to 64-site testing in two months. The chip maker intends to use additional V93000 Dragon systems in 2014.
After conducting a thorough evaluation, SHHIC determined that the V93000 Smart Scale platform with an A-Class test head perfectly supports its roadmap for high-multi-site testing. The universal pin design with its asynchronous clock-domain-per-pinTM capability can achieve multi-site efficiency (MSE) of up to 99.9 percent, and the application module on-board (AMO) solution provides the test coverage and economic performance required by RFID IC suppliers.
"Advantest's V93000 Dragon system delivers the flexibility, performance and unique capabilities, enabling the low cost of test that we require for our RFID product lines," said Junqing Wang, senior product engineering manager for SHHIC. "In addition, we value Advantest's expert customer support, including access to Advantest's development center and its field service engineering team, as we continuously work to improve our production efficiencies and reduce time to market."
The Dragon series' A-Class tester uses an ultra-compact test head with up to 1,024 pins. The advantages of this configuration include minimal footprint, low power usage, simplified infrastructure and low maintenance, all of which contribute to the lowest cost of ownership. In addition, all V93000 Dragon testers use an innovative test processor that eliminates the need for expensive components to test advanced CMOS devices. The test processor offers the highest integration in the ATE industry.
All classes of V93000 Smart Scale testers are compatible, providing users with the flexibility to shift semiconductor devices from one Smart Scale class to another as their production volumes and testing needs change over time.
Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.