Second-Generation Solution Provides Comprehensive View ofTest Operations to Reduce Costs
TOKYO, Japan – June 27, 2013 – Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857, NYSE: ATE) has introduced its newest Test Floor Intelligence software solution, TFI 2.0, designed to improve the overall equipment effectiveness (OEE) of production test operations by efficiently mining and analyzing the large volume of data generated during semiconductor testing.
“Optimizing OEE is not a simple task. It requires a combination of rich data sources, fast analytics and automated process control to optimize tester utilization, test time, maintenance cycles and effective yield,” said Stephen Ledford, director of global production solutions at Advantest. “Our TFI 2.0 is the first step in delivering integrated data collection and reporting for all Advantest testers accessible from a single server, enabling flexible factory integration based on an open solution architecture.”
Advantest's second-generation TFI solution performs real-time data collection, control and web-based reporting, enabling test-floor managers to instantly assess tester utilization, equipment status, fault detection, effective yield and other key operating parameters. The system also identifies potential problems relating to the test program, interface hardware and test equipment before they impact productivity.
The software suite manages the rich data infrastructure available from today's automatic test equipment (ATE), which goes well beyond traditional test data logs to include real-time equipment status and health, maintenance records and test cell configuration. It delivers unprecedented interactivity, customizability and scalability while handling terabytes of test data.
“OEE has become a major priority for semiconductor companies and OSATs (outsourced semiconductor assembly and test) as they work to optimize every aspect of the test process,” said Ron Leckie, industry analyst and consultant at Infrastructure Advisors. “While multi-site testing has had a big, positive impact on equipment efficiency, the next major gains will likely come from a new generation of software tools that actively monitor and control the overall test process including ATE, handlers and probers, interface hardware, test programs and test operations.”
Designed for use by major fabless IC companies, OSATs and semiconductor foundries, TFI 2.0 will be available worldwide in July 2013.
Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.