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Jun 25, 2020 Topics

Virtual Exhibition and Live-Stream Presentations Facilitate Real-time Interactions with Users

TOKYO, Japan – June 24, 2020 – Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) will host its own virtual trade show at 7:00 p.m. – 11:00 p.m. Pacific Daylight Time (PDT) on Thursday, July 9 to showcase its latest IC test solutions and demonstrate technology leadership. The company’s objective is to continue sharing best practices and information about its most recent advancements in semiconductor testing with users in Asia, and around the world, despite the cancellation of many industry gatherings due to travel restrictions and health concerns over the COVID-19 pandemic.

“We are excited to host our own virtual trade show, adopting a novel online communication method to deliver information about our latest test solutions to our customers, and provide them opportunities to directly interact with our technical experts,” said Judy Davies, vice president of global marketing communications at Advantest.

Virtual Exhibition

Advantest’s online event includes a virtual exhibition booth, showcasing the company’s broad end-to-end solutions focusing on advanced applications, such as 5G, automotive, and memory. The test solutions to be featured in the virtual booth include Advantest’s V93000 Wave Scale™ RF8 card for 5G-NR transceivers and other connectivity ICs up to 8GHz; T2000 series for higher parallelism and lower cost of test of system-on-chips (SoCs) used in automobiles; as well as a number of Advantest’s leading memory test solutions, including the new H5620 , MPT3000 and T5503HS2 series.

In addition to application-focused test solutions, Advantest will showcase its test automation solution composed of test handlers and automation software tools, and design validation solution including CX1000 series offering cost-effective, on-demand test solutions.

Live-Stream Presentations

During the live virtual event, Advantest’s technical experts will live-stream presentations on the newest semiconductor-testing technologies and best practices. Each session will provide attendees with opportunities to ask questions. The agenda for the virtual session is:

Thursday, July 9

7:10 p.m.
Pacific Daylight Time (PDT)
Welcome and Overview (in English)
Judy Davies, Vice President of Global Marketing Communications, Advantest
7:25 p.m.
Pacific Daylight Time (PDT)
Addressing SoC Test Challenges from 5G to AI in the Age of Convergence (in Chinese)
Daniel Sun, Test Expert, Advantest China
8:15 p.m.
Pacific Daylight Time (PDT)
Best Integrated Solution for Next-Generation DDIC, CIS and PMIC (in Chinese)
Steven Wang, Application Engineer, Advantest China
10:00 p.m.
Pacific Daylight Time (PDT)
End-to-End Full Memory Test Solutions (in Chinese)
Albert Chen, MTS Application Engineer, Advantest China

How to Register

Please pre-register for this virtual event to receive a log-in instruction:
https://advantest.6connex.com/event/advantestvirtualevent/asiatradeshow/login

Social Media

For all the latest news from the leader in test solutions, follow Advantest on Twitter @Advantest_ATE.

Note: All information supplied in this release is correct at the time of publication, but may be subject to change.