Advantest Enables a Single-Source Supply of Integrated Test Cells for SoC Devices
Achieving the most economical, productive and flexible test solutions for advanced system-on-chip (SoC) devices – including power-management ICs, application processors and microprocessor units – requires an integrated test cell, combining a high-performance test platform with a compatible, versatile handling system to achieve maximum throughput at the lowest possible cost of test.
Advantest, the world leader in semiconductor test equipment, offers this solution with its M4871 pick-and-place handler. The handler integrates Advantest's proven technology from the company's existing product lines with advanced, new functions including visual alignment with high throughput, active thermal control using Advantest's Tri-Temp capability and a new handler data visualization framework that enables users to conduct real-time monitoring of a test cell's production status from any network-enabled connection.
Reduced Cycle Time Leads to Greater Test-Cell Productivity
The M4871 handler features a variety of capabilities for improving test yields and reducing cycle times. An advanced visual-alignment function enables positioning accuracy of below 0.3 mm ball/pad pitch for handling fine- pitch semiconductors and devices with both top- and bottom-side contacts. This precise alignment capability also helps to speed up set-up and calibration times for greater test-cell productivity.
Active Thermal Control
Using ADVANTEST’s Tri-Temp technology, the M4871 handler can operate over a broad range of temperatures. It also allows power dissipation during test typically for APU/CPU/SoC device to maintain actual die temperature for avoiding thermal runaway. On the other hand, Tri-Temp technology can provide longer defrosting cycle comparing to current chamber type handler which use liquid nitrogen, reducing the need for this scheduled maintenance step.
Through its highly efficient operation, the handler can provide users with 20 or more additional hours of productive testing time per month, achieving greater overall equipment effectiveness (OEE) and reducing the cost per device.
Upgraded Design Enables Quick and Easy Enhancements
In its basic configuration, the M4871 can handle 16 DUTs in parallel for a total throughput of up to 15,000 devices per hour. The field-upgradeable design enables quick and easy enhancements to increase parallelism as high as 32X, handle higher-pin-count devices, achieve greater power efficiency in temperature control, reduce the cost of change-over kits and make other improvements over the life of the handler.
|Target Packages||BGA, CSP, WLCSP, QFP, TQFP, SSOP, TSOP, QFN and others|
|Simultaneous Testing||Up to 16 devices|
|Throughput||15,000 devices per hour (maximum)|
|Temperature Range||-40°C to 125°C|