LCD Driver Test System
Tester enables cost-efficient testing of display driver ICs for high-resolution flat-panel displays, combining advanced test capabilities and high throughput
High-resolution flat-panel displays (LDCs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI’s with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
Versatile and extendible
The T6391 provides wide test coverage for all types of applications including analog, memory and logic circuits with high pin counts and high-speed interfaces. This versatility stems from the system’s pin-card design, which makes it the best test solution for both engineering and production applications.
This tester was developed to address both the current and future needs of customers worldwide. It is capable of testing Touch and Display Driver Integration (TDDI), PMIC functions embedded within DDIs, a projected advancement in next-generation devices. To optimize its operation and cost efficiency, the system uses the same TDL programming environment as other testers in ADVANTEST's T6300 product family.
Greater operating efficiency for high throughput
The system can test several devices in parallel and perform large-volume testing of high-resolution DDIs with up to 3,584 pins, including those used in full high-definition (Full HD), QHD and 4K displays. Industry-leading throughput is enabled by the T6391's high-speed bus, which enhances data transfer and calculation speeds with its 1,024 I/O channels.
A test solution for advanced ICs
To test DDIs using the MIPI interface, the standard protocol for mobile electronics, the T6391 can handle I/O pin frequencies up to 1.6 Gbps. When equipped with an additional measurement module, the system can test even faster 6.5-Gbps interfaces that are used in DDIs for ultra-high-definition televisions including the 4K (2160p) generation.
|Target devices||All kinds of DDIs including Mobile / Source Driver ICs, High Resolution and Touch Embedded ICs|
|Simultaneous testing||Maximum 32 devices|
|LCD measurement||3,584 channels (maximum), per-pin digitizer and per-pin DC section|
|Digital measurement||Data rate: up to 1.6Gbps by Digital I/O (1,024ch), 6.5Gbps by UHSIF (32lane)|
|Analog measurement||ADC test signal generator module, Ramp Wave Generator function|